CMIt 政美應用

政美應用股份有限公司成立於1995年，初期以高端量測設備銷售代理為主要營業項目，政美應用於2010年開啟在高精度自動檢測(AOI)、量測(Metrology)領域的自主研究與發展。透過自行開發的可擴充模組化軟體平台，結合自有光學影像及光路設計技術，整合出優異的自動化2D/3D檢測、量測性能機台，應用在先進封裝、MicroLED、化合物半導體等主要製程領域。其中，先進封裝重新佈線(RDL)、矽中介層(Interposer)的關鍵製程，更是我們所專精的量檢測環節。

Cheng Mei Instrument Technology.,Ltd. was founded in 1995. Initially, its primary business was the sales and distribution of high-end measurement equipment. In 2010,CMIt began independent research and development in the fields of high-precision automated inspection(AOI) and metrology. By leveraging its proprietary modular software platform along with advanced optical imaging and optical path design technologies, CMIT delivers high-performance automated 2D/3D inspection and metrology systems for advanced packaging, MicroLED, and compound semiconductor manufacturing.Our core strengths lie particularly in RDL and interposer inspection and metrology, which are critical processes in next-generation advanced packaging.